From china-industrial-economics-skills
Use when the identification strategy for a 《中国工业经济》 (China Industrial Economics) manuscript is multi-period / staggered DID or an event study. Mandates parallel-trends event-study plots, placebo tests, and modern heterogeneity-robust estimators (Callaway-Sant'Anna, Sun-Abraham, de Chaisemartin-D'Haultfœuille, Goodman-Bacon decomposition) whenever treatment timing varies.
How this skill is triggered — by the user, by Claude, or both
Slash command
/china-industrial-economics-skills:cie-did-identificationThe summary Claude sees in its skill listing — used to decide when to auto-load this skill
- 实证主体是 DID / 多期(交错)DID / event-study
cie-tables-figures)cie-robustness)| 审稿期待 | 达标证据 | 常见退稿模式 |
|---|---|---|
| 平行趋势可视化 | 事件研究图 + 处理前联合检验 | 仅文字"满足"、无图 |
| 交错处理不偏 | Bacon 分解 + CS/SA/dCDH 主结果 | TWFE 跑到底、不提负权重 |
| 安慰剂稳健 | 随机化时点+对象 500—1000 次 | 只换一次处理组就称通过 |
| 聚类合理 | 聚类到分配层级(城市/行业) | 聚类到个体、低估标准误 |
| 竞争政策剔除 | 剔同期试点样本 | 不提同期政策、识别被混淆 |
识别类意见是本刊退修的首要触发点;具体口径以编辑部最新外审标准与稿约为准,不臆造拒稿比例。
示意稿件:分三批的"智能制造试点示范",TWFE 得 Treat×Post +0.043。按本刊红线走查:诊断为交错处理后做 Goodman-Bacon 分解(示意坏比较权重 18%,不可忽略);改用 Callaway-Sant'Anna,示意聚合 ATT +0.038(与 TWFE 接近,稳定),并列 Sun-Abraham;画 t=-4…+4 事件研究图,处理前联合检验 p=0.42(示意);安慰剂伪试点 1000 次真实 +0.038 落尾部;聚类到城市后标准误升至 0.012 仍 1% 显著。结论:主结果可立,进入 cie-mechanism。
cie-institutional-background 讲遴选规则,预告 PSM-DID。【识别策略】两期DID / 交错DID / event-study / 连续DID
【平行趋势】事件研究图 √ / 缺
【安慰剂】时点随机 □ 对象随机 □ / 缺
【交错处理】Bacon分解 □ CS/SA/dCDH 估计 □ / N.A.
【聚类层级】<…>
【缺失检验】<…>
【下一步】cie-mechanism
npx claudepluginhub brycewang-stanford/awesome-journal-skills --plugin china-industrial-economics-skillsStress-tests quasi-experimental identification strategies (DID, IV, RDD, DML) for economic research manuscripts against modern estimators and reporting standards.
Guides causal identification strategy design for Management-World manuscripts: validates quasi-experimental designs (DID, IV, RDD, DML, event study) with Chinese policy shocks, checks parallel trends, weak instruments, staggered DiD biases.
Reviews causal identification strategies (DID, IV, RDD, PSM, DML) for empirical economics manuscripts, stress-testing designs and checking diagnostics like parallel trends, weak instruments, and balance.