UV-Vis-NIR Analyzer

Purpose

The UV-Vis-NIR Analyzer skill provides optical characterization of nanomaterials, enabling analysis of electronic transitions, plasmon resonances, and optical bandgaps essential for photonic and optoelectronic applications.

Capabilities

• Absorption/transmission/reflectance spectra
• Localized surface plasmon resonance (LSPR) analysis
• Bandgap determination (Tauc plot)
• Quantum dot emission characterization
• Beer-Lambert quantification
• Aggregation monitoring

Usage Guidelines

Optical Analysis

1. LSPR Analysis

   • Monitor peak position and width
   • Track sensitivity to environment
   • Assess size and shape effects

2. Bandgap Determination

   • Apply Tauc plot method
   • Select direct/indirect transition
   • Report with uncertainty

3. Concentration Quantification

   • Apply Beer-Lambert law
   • Verify linear range
   • Account for scattering

Process Integration

• Multi-Modal Nanomaterial Characterization Pipeline
• Structure-Property Correlation Analysis
• Nanosensor Development and Validation Pipeline

Input Schema

{
  "spectrum_file": "string",
  "measurement_type": "absorbance|transmittance|reflectance",
  "analysis_type": "lspr|bandgap|concentration",
  "material_type": "metal_np|semiconductor|quantum_dot"
}

Output Schema

{
  "lspr": {
    "peak_position": "number (nm)",
    "fwhm": "number (nm)",
    "extinction_coefficient": "number"
  },
  "bandgap": {
    "value": "number (eV)",
    "transition_type": "direct|indirect"
  },
  "concentration": {
    "value": "number",
    "unit": "string",
    "extinction_used": "number"
  }
}